The main purpose of the paper is to construct the four probes to calculate the sheet resistance the thin film. For the thin film this paper presents the experimental preparation of Tin dioxide thin films. A dual voltage power supply and constant current source is developed to study deeply for the constant current output. Electrical properties are measured using constant current source, sheet resistance, four probe), digital multimeter and micro ammeter. The effect of thickness of sheet resistance thin film is carried out by four probe method.
| Published in | American Journal of Physics and Applications (Volume 5, Issue 5) |
| DOI | 10.11648/j.ajpa.20170505.11 |
| Page(s) | 60-65 |
| Creative Commons |
This is an Open Access article, distributed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution and reproduction in any medium or format, provided the original work is properly cited. |
| Copyright |
Copyright © The Author(s), 2017. Published by Science Publishing Group |
Tin Dioxide, Four Probe, Spin Coating Method, Sheet Resistance
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APA Style
Rikesh Bhattarai, Shankar Prasad Shrestha. (2017). Construction of Sheet Resistance Measurement Setup for Tin Dioxide Film Using Four Probe Method. American Journal of Physics and Applications, 5(5), 60-65. https://doi.org/10.11648/j.ajpa.20170505.11
ACS Style
Rikesh Bhattarai; Shankar Prasad Shrestha. Construction of Sheet Resistance Measurement Setup for Tin Dioxide Film Using Four Probe Method. Am. J. Phys. Appl. 2017, 5(5), 60-65. doi: 10.11648/j.ajpa.20170505.11
AMA Style
Rikesh Bhattarai, Shankar Prasad Shrestha. Construction of Sheet Resistance Measurement Setup for Tin Dioxide Film Using Four Probe Method. Am J Phys Appl. 2017;5(5):60-65. doi: 10.11648/j.ajpa.20170505.11
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Download@article{10.11648/j.ajpa.20170505.11,
author = {Rikesh Bhattarai and Shankar Prasad Shrestha},
title = {Construction of Sheet Resistance Measurement Setup for Tin Dioxide Film Using Four Probe Method},
journal = {American Journal of Physics and Applications},
volume = {5},
number = {5},
pages = {60-65},
doi = {10.11648/j.ajpa.20170505.11},
url = {https://doi.org/10.11648/j.ajpa.20170505.11},
eprint = {https://article.sciencepublishinggroup.com/pdf/10.11648.j.ajpa.20170505.11},
abstract = {The main purpose of the paper is to construct the four probes to calculate the sheet resistance the thin film. For the thin film this paper presents the experimental preparation of Tin dioxide thin films. A dual voltage power supply and constant current source is developed to study deeply for the constant current output. Electrical properties are measured using constant current source, sheet resistance, four probe), digital multimeter and micro ammeter. The effect of thickness of sheet resistance thin film is carried out by four probe method.},
year = {2017}
}
TY - JOUR T1 - Construction of Sheet Resistance Measurement Setup for Tin Dioxide Film Using Four Probe Method AU - Rikesh Bhattarai AU - Shankar Prasad Shrestha Y1 - 2017/08/03 PY - 2017 N1 - https://doi.org/10.11648/j.ajpa.20170505.11 DO - 10.11648/j.ajpa.20170505.11 T2 - American Journal of Physics and Applications JF - American Journal of Physics and Applications JO - American Journal of Physics and Applications SP - 60 EP - 65 PB - Science Publishing Group SN - 2330-4308 UR - https://doi.org/10.11648/j.ajpa.20170505.11 AB - The main purpose of the paper is to construct the four probes to calculate the sheet resistance the thin film. For the thin film this paper presents the experimental preparation of Tin dioxide thin films. A dual voltage power supply and constant current source is developed to study deeply for the constant current output. Electrical properties are measured using constant current source, sheet resistance, four probe), digital multimeter and micro ammeter. The effect of thickness of sheet resistance thin film is carried out by four probe method. VL - 5 IS - 5 ER -
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